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SURFACE ROUGHNESS EVALUATION METHOD, SURFACE ROUGHNESS EVALUATION DEVICE, AND GLASS SUBSTRATE
专利权人:
NIPPON ELECTRIC GLASS CO., LTD.
发明人:
TAKAHASHI Yuji,ONO Kazuhiro,NAKATSUKA Hiroki,OKU Hayato
申请号:
WO2016JP64092
公开号:
WO2016190117(A1)
申请日:
2016.05.12
申请国别(地区):
世界知识产权组织国际局
年份:
2016
代理人:
摘要:
A laminated body 3 is created by stacking a glass substrate 1 and a reference glass substrate 2, in a state where an evaluation surface for evaluating the surface roughness of the glass substrate 1 is brought into contact with a reference smooth surface of the reference glass substrate 2. Pressure is applied locally to the top surface of the laminated body 3, and on the basis of the state of change that is brought about by such pressure in the region where the evaluation surface of the glass substrate 1 and the reference smooth surface of the reference glass substrate 2 are closely adhered, the surface roughness of the evaluation surface of the glass substrate 1 is evaluated. The state of change in the closely-adhered region is measured using the speed at which the closely-adhered region, having a pressed section A as the center thereof, expands in the radial direction.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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