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Extended depth of field microscope system
专利权人:
Industrial Technology Research Institute
发明人:
Chen Yung-Lin,Sung Hsin-Yueh,Chang Chir-Weei
申请号:
US201213354339
公开号:
US9116101(B2)
申请日:
2012.01.20
申请国别(地区):
美国
年份:
2015
代理人:
Jianq Chyun IP Office
摘要:
An extended depth of field microscope system for phase object detection includes an imaging optical module and a phase/intensity converting module. The imaging optical module has an object lens group, in which an axial symmetric phase coding is added, to produce an axial symmetric spherical aberration. A point spread function (PSF) and an image with extended depth of field can be obtained with a predetermined level of similarity. The phase/intensity converting module converts the phase change of the light passing the phase object, into an image light with change of light intensity.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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