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GRAIN QUALITY LEVEL DISCRIMINATION DEVICE
专利权人:
SATAKE CORPORATION
发明人:
Hiroki ISHIZUKI,Akira ETO,Takahiro DOI,Hiroaki TAKEUCHI
申请号:
US15536723
公开号:
US20170350825A1
申请日:
2015.12.18
申请国别(地区):
US
年份:
2017
代理人:
摘要:
An object of the present invention is to improve the quality level discrimination accuracy of the grain G by a grain quality level discrimination device. The device includes an optical unit 3 that emits light to the grain G, receives reflected and/or transmitted light from the grain G by a photosensor, and obtains information for discrimination of the quality level of the grain G from the upper and lower surface side of the grain G, and a quality level discrimination unit 7 that discriminates the quality level of the grain G on the basis of the information. The information on the upper and lower surface sides can be acquired by one optical unit at the same time so that the divergence therebetween due to the displacement or variation of the attitude of the grain G can be avoided. The reference plate for the correction of the information is placed outside of the moving path of the grain G to prevent it from soiling or damaging. Thus the deterioration of information can be avoided. Further, a reference plate especially for the information to be obtained from the side surface of the grain G may be provided for enhancing the accuracy of the side surface information. Thus the quality level discrimination accuracy can be improved further.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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