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DIAGNOSIS SUPPORTING APPARATUS AND DIAGNOSIS SUPPORTING METHOD
专利权人:
SAMSUNG ELECTRONICS CO.; LTD.
发明人:
Moon Ho PARK
申请号:
US14877510
公开号:
US20160095576A1
申请日:
2015.10.07
申请国别(地区):
US
年份:
2016
代理人:
摘要:
Provided are a diagnosis supporting apparatus and a diagnosis supporting method that analyzes characteristics of medical examinations and supports diagnosis, in which examination characteristics of a practitioner may be analyzed by comparing the characteristics with a reference examination, thereby enabling accurate and efficient diagnosis. The diagnosis supporting apparatus includes: an examination path acquiring component configured to acquire an examination path of an examination device; an examination characteristic analyzer configured to analyze characteristics of the examination based on the acquired examination path by using reference examination information; and a diagnosis component configured to determine an analysis point based on the reference examination and the analyzed examination characteristics, and to obtain a diagnosis with respect to one or more images that relate to the analysis point on the examination path.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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