X-ray phase contrast imaging with fourier transform determination of grating displacement

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专利权人:

Shimadzu Corporation

发明人:

Naoki Morimoto,Taro Shirai,Takahiro Doki,Satoshi Sano,Akira Horiba

申请号：

US15958048

公开号：

US10801971B2

申请日:

2018.04.20

申请国别(地区):

US

年份:

2020

代理人:

摘要：

An X-ray phase contrast imaging system includes an X-ray source, a detector, a plurality of gratings including a first grating and a second grating, and a grating positional displacement acquisition section configured to obtain a positional displacement of the grating based on a Fourier transform image obtained by Fourier transforming an interference fringe image detected by the detector.

来源网站：

中国工程科技知识中心

来源网址：

http://www.ckcest.cn/home/