SAMPLE PRETREATMENT METHOD IN X-RAY DIFFRACTION

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专利权人:

SUMITOMO METAL MINING CO LTD

发明人:

HAYASHI KAZUHIDE

申请号：

JP20030001838

公开号：

JP2004212314(A)

申请日:

2003.01.08

申请国别(地区):

日本

年份:

2004

代理人:

摘要：

PROBLEM TO BE SOLVED: To acquire crystal information about a specified crystal grain, irrespective of the kind of material. SOLUTION: An area other than the crystal grain of a measuring object is coated thinly with an amorphous liquid material, an amorphous powder of high X-ray absorptivity is further applied thereto to be fixed, and only the crystal information about a specified crystal is thereby acquired by X-ray diffraction. COPYRIGHT: (C)2004,JPO&NCIPI

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中国工程科技知识中心

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