KIM DUCK YOUNG;SUNG NAK HYOUN;PARK YONG WOO;YOOK YOUNG CHOON
发明人:
KIM DUCK YOUNG,SUNG NAK HYOUN,PARK YONG WOO,YOOK YOUNG CHOON
申请号：
US20010779590
公开号：
US2002048016(A1)
申请日:
2001.02.09
申请国别(地区):
美国
年份:
2002
代理人:
摘要：
Disclosed are an apparatus and method for measuring the refractive index distribution of an optical fiber or waveguide by measuring a variation in reflectivity on the surface of the optical fiber or waveguide depending upon the position on the surface of the optical fiber or waveguide while scanning the optical fiber or waveguide surface at a fixed scanning height using three laser beams of different wavelengths projected onto the optical fiber or waveguide surface. In accordance with the present invention, a high spatial resolution is obtained, as compared to conventional measuring devices using a refraction phenomenon. It is also possible to remarkably reduce measuring errors because a high signal-to-noise ratio is provided, as compared to conventional measuring devices using a scanning near field optical microscope. Also, there is an effect capable of achieving a precise measurement for the reflective index distribution essentially required in the design and manufacture of optical fibers or waveguides with a micro structure.
