Dennis J Faucher;Ryan M Ferguson;Jeffrey D Brown;Adam D DeNoble;Jeffrey W Fritz;Gottfried J Hohm
发明人:
Jeffrey D Brown,Dennis J Faucher,Jeffrey W Fritz,Gottfried J Hohm,Adam D DeNoble,Ryan M Ferguson
申请号：
US13196663
公开号：
US09603752B2
申请日:
2011.08.02
申请国别(地区):
US
年份:
2017
代理人:
摘要：
Apparatus and methods are provided to minimize waste and improve quality and production in web processing operations. The apparatus and methods provide defect detection both before and after application of component patches to a traveling web to create a product. Web defect detection may be provided by way of at least one visual inspection station located upstream from the patch applicator. Patch defect detection may be accomplished by way of a visual inspection station located proximate the patch applicator. If defects are detected in either the traveling web or the component patch prior to patch application, patch application may be prevented until both a satisfactory web and patch are provided. If defects are detected after patch application, the resulting product may be culled. Furthermore, the apparatus may be provided with diagnostic software to warn against extant or imminent machine complications.
