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System and method for estimating electrical conduction delays from immittance values measured using an implantable medical device
专利权人:
Brian Jeffrey Wenzel
发明人:
Brian Jeffrey Wenzel,Dorin Panescu,Mihir Naware,Jeffery Siou
申请号:
US12127963
公开号:
US08208999B2
申请日:
2008.05.28
申请国别(地区):
US
年份:
2012
代理人:
摘要:
Techniques are provided for estimating electrical conduction delays with the heart of a patient based on measured immittance values. In one example, impedance or admittance values are measured within the heart of a patient by a pacemaker or other implantable medical device, then used by the device to estimate cardiac electrical conduction delays. A first set of predetermined conversion factors may be used to convert the measured immittance values into conduction delay values. In some examples, the device then uses the estimated conduction delay values to estimate LAP or other cardiac pressure values. A second set of predetermined conversion factors may be used to convert the estimated conduction delays into pressure values. Techniques are also described for adaptively adjusting pacing parameters based on estimated LAP.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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