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Measurement probe and optical measurement system
专利权人:
发明人:
Seiki Toriyama
申请号:
US15266406
公开号:
US09986891B2
申请日:
2016.09.15
申请国别(地区):
US
年份:
2018
代理人:
摘要:
A measurement probe includes: a plurality of optical fibers including an illumination fiber configured to propagate light to irradiate a measuring object and including a light receiving fiber configured to receive scattered light retuned from the measuring object and a detection portion configured to detect contact with the measuring object, the detection portion having a contact part provided on a part of a side portion of the measurement probe, the side portion forming a surface along a longitudinal direction of the measurement probe, the contact part being configured to be in contact with measuring object.
来源网站:
中国工程科技知识中心
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