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Method for estimation and correction of grid pattern due to scatter
专利权人:
发明人:
Joseph Manak,Amit Jain,Hisato Takemoto
申请号:
US15099720
公开号:
US10098603B2
申请日:
2016.04.15
申请国别(地区):
US
年份:
2018
代理人:
摘要:
An apparatus for generating corrected X-ray projection data from target X-ray projection data obtained by performing an X-ray scan with a detector having an anti-scatter grid, and a method for creating a lookup table and generating corrected X-ray projection data. The apparatus includes a detector configured to detect incident X-rays, an anti-scatter grid configured to suppress scattered radiation incident on the detector, and an X-ray source configured to irradiate the target with X-rays. Processing circuitry is configured to cause the X-ray source to scan, using a peak kilovoltage (kVp), the target to produce the target projection data, determine a patient-to-detector distance (PDD) and an area irradiated (FS), transform the target projection data into a spatial frequency domain, determine scatter values by accessing the lookup table using the kVp, PDD, and FS values, and subtract the scatter values from the frequency components to obtain the corrected X-ray projection data.
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