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PARAMETER MEASUREMENT DEVICE FOR EYEGLASS FITTING AND PARAMETER MEASUREMENT PROGRAM FOR EYEGLASS FITTING
专利权人:
Nidek Co.; Ltd.
发明人:
OZAKI, Yoshihiro,ARIKAWA, Toru,KOBAYASHI, Toshihiro,TOCHIKUBO, Yujiro
申请号:
EP14846973
公开号:
EP3051332A4
申请日:
2014.09.26
申请国别(地区):
EP
年份:
2017
代理人:
摘要:
The present disclosure allows favorable acquisition of parameters. An eyeglass fitting parameter measurement device for measuring eyeglass fitting parameters for an examinee by analyzing a front image of the examinee wearing an eyeglass frame and a lateral image of the examinee wearing the eyeglass frame. The eyeglass fitting parameter measurement device includes: a display control unit that displays the front image and the lateral image on a display part and a position information detection unit that detects position information for determining the positions of the examinees eyes or the eyeglass frame based on one of the front image and the lateral image. The display control unit provides a correspondence indication corresponding to the position information detected by the position information detection unit in a display area for the other of the front image and the lateral image based on the position information.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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