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Eyeglass fitting parameter measurement device and storage medium storing eyeglass fitting parameter measurement program
专利权人:
LTD.;NIDEK CO.
发明人:
Yoshihiro Ozaki,Toru Arikawa,Toshihiro Kobayashi,Yujiro Tochikubo
申请号:
US15080051
公开号:
US10067361B2
申请日:
2016.03.24
申请国别(地区):
US
年份:
2018
代理人:
摘要:
There is an provided eyeglass fitting parameter measurement device including: a display control unit that displays a front image of an examinee wearing an eyeglass frame and a lateral image of the examinee wearing the eyeglass frame on a display part; and a position information detection unit that detects position information for determining the positions of the examinee's eyes or the eyeglass frame based on one of the front image and the lateral image. The display control unit provides a correspondence indication corresponding to the position information detected by the position information detection unit in a display area for the other of the front image and the lateral image based on the position information.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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