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METAL DETECTING DEVICE
专利权人:
ANRITSU INFIVIS CO., LTD.
发明人:
HAYAKAWA, Yuki,TANIGUCHI, Eiji,OHASHI, Akira,YAMAGUCHI, Tomohiko
申请号:
WO2018JP19720
公开号:
WO2018216702(A1)
申请日:
2018.05.22
申请国别(地区):
世界知识产权组织国际局
年份:
2018
代理人:
摘要:
This metal detecting device is provided with: a detecting circuit unit (30) which executes a detection process of a first fluctuating component of a magnetic field fluctuating signal from a magnetic field receiving unit (23), the first fluctuating component having a large workpiece influence, and a second fluctuating component thereof having a large metal influence; a determining unit (40) which executes a metal detection determination process in a workpiece (W) by comparing the two fluctuating components; and a detection condition adjusting unit (60) which adjusts detection conditions of the two fluctuating components. The metal detecting device is provided with a foreign body waveform storage unit (50) in which is stored a test fluctuating component which accompanies a variation over time due to a metal influence. The detection condition adjusting unit (60) sets specific processing conditions for the detection process performed by the detecting circuit unit (30), on the basis of the first fluctuating compon
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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