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METHOD AND DEVICE FOR EVALUATING CAPABILITY TO INDUCE RESISTIVITY
专利权人:
SHIZUOKA PREFECTURE
发明人:
IYOSUMI HIROYUKI,INAGAKI HIDEHIRO,KATO KIMIHIKO,NUKUI HIDEKI
申请号:
JP20080084091
公开号:
JP2009236731(A)
申请日:
2008.03.27
申请国别(地区):
日本
年份:
2009
代理人:
摘要:
<P>PROBLEM TO BE SOLVED: To provide a method and device for evaluating capability to induce resistivity for certainly evaluating the capability to induce resistivity by a material to be inspected. ??<P>SOLUTION: An appropriate method for evaluating capability to induce resistivity is a method of evaluating the degree of capability to induce the resistivity of the material to be inspected to a plant. The sample of the plant in the state that the cell of the plant is cultivated and arrives at the later stage of the logarithmic growth period, and a light emission causing substance are used. The sample of the plant is left at rest, then a reference substance having no capability to induce resistivity is brought into contact with it and is left at rest. The light emission causing substance is further brought into contact with it, and the intensity of the caused light emission is measured and set as a reference light emission intensity. The sample of the plant is left at rest, and the material to be inspected is brought into contact with it. The light emission causing substance is further brought into contact with it. The intensity of the caused light emission is measured and set as a comparative light emission intensity. The reference light emission intensity is compared with the comparative light emission intensity, and the level of the resistivity inducing capability of the material to be inspected is evaluated. ??<P>COPYRIGHT: (C)2010,JPO&INPIT ??
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