The present invention relates to a device for scatter correction in an X-ray image, the X-ray image (30, 40) having a superimposed structured pattern, the device (1) comprising: an X-ray image receiving element (10)； a pattern remover (11)； and a first subtraction module (12)； wherein the X-ray image receiving element (10) is configured to receive an X-ray image (30, 40) comprising a superimposed structured pattern (31)； wherein the pattern remover (11) is configured to remove the structured pattern (31) from the X-ray image (30, 40) resulting in a pattern corrected X-ray image (43)； wherein the first subtraction module (12) is configured to subtract the pattern corrected X-ray image (33, 43) from the X-ray image (40) resulting in a structured pattern image (32, 42)； and wherein a contrast measurement unit (13) is configured to apply a local structure contrast measurement function to the structured pattern image (32, 42) resulting in a structure contrast image (34, 44). The invention improves the scatter correction of an X-ray image.
