To provide an image sensor capable of realizing a compatibility between further miniaturization and high image quality. The image sensor includes: a plurality of transfer capacities 252, each capacity 252 being provided at a respective one of vertical transfer lines 239 and having a trench structure a plurality of column reading circuits, each column reading circuit including a column source follower transistor 244 and a clamp switch 253, each column reading circuits being provided at a respective one of the vertical transfer lines 239 and separated from the transfer capacity 252 by a second diffusion layer 31 a plurality of column scanning circuits, each column scanning circuit including the column selection switch 254 connected to a vertical transfer line 239 via the transfer capacity 252 and configured to output imaging signals from the vertical transfer lines 239 via the column source follower transistors 244, each column scanning circuit being provided at a respective one of the column reading circuits a horizontal transfer line 258 configured to transfer the imaging signals and a constant current source 257.