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光干渉断層撮像装置及び光干渉断層撮像方法
专利权人:
キヤノン株式会社
发明人:
廣瀬 太
申请号:
JP2008234780
公开号:
JP5339828B2
申请日:
2008.09.12
申请国别(地区):
JP
年份:
2013
代理人:
摘要:
An optical coherence tomographic apparatus wherein a reference light path includes at least a first reference light path and a second reference light path having an optical path length shorter than that of the first reference light path, wherein first tomographic information of the object at a first inspection position based on the optical interference using the first reference light path and second tomographic information of the object at a second inspection position based on the optical interference using the second reference light path, are acquired, the second inspection position being shallower than the first inspection position with respect to a depth direction of the object, and wherein a positional deviation a tomographic image at the first inspection position obtained based on the first tomographic information is corrected using the second tomographic information.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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