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SYSTEMS AND METHODS FOR DETERMINING RELATIONSHIPS BETWEEN DEFECTS
专利权人:
Palantir Technologies Inc.
发明人:
Poh Andrew,Menck Andre Frederico Cavalheiro,Sprague Arion,Grabham Benjamin,Lee Benjamin,Rahill-Marier Bianca,Omont Gregoire,Inoue Jim,Scheinerman Jonah,Albin Maciej,Scolnick Myles,Gribelyuk Paul,Fackler Steven,Nguyen Tam-Sanh,Powell Thomas,Seaton William
申请号:
US201615385664
公开号:
US2018173212(A1)
申请日:
2016.12.20
申请国别(地区):
美国
年份:
2018
代理人:
摘要:
Systems and methods are provided for identifying relationships between defects. The system may obtain defect items and associated information. Defect items may be compared to one another based on their attributes to determine how related they are. According to the comparisons, defect items may be grouped together into issue items for further analysis by a user. The system may further update a defect comparison model according to user interaction with defect items.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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