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APPARATUS AND METHOD FOR IDENTIFYING DEFECTS AND DETERMINING DEFECT DEPTH IN FERROMAGNETIC STRUCTURES BASED ON MAGNETIC FLUX LEAKAGE
专利权人:
THE CHARLES STARK DRAPER LABORATORY, INC.
发明人:
IANNUCCI, Michael J.,TRINKLE, William J.,GOSSAGE, Arturo D.
申请号:
WO2017US45917
公开号:
WO2018031556(A9)
申请日:
2017.08.08
申请国别(地区):
世界知识产权组织国际局
年份:
2018
代理人:
摘要:
The system and method involve a permanent magnetization induction process for ferromagnetic structures, carried out to the saturation point to overwhelm the intrinsic magnetic fields in the structures. The permanent magnetization to overwhelm the intrinsic magnetization eliminates the effect of intrinsic fields for subsequent measurements. The permanent magnetization along a hollow structure yields two residual magnetic field components: axial and circumferential. The circumferential component varies as a function of depth. Thus, an analysis system can analyze defects and the depth of those defects by detecting the direction of the magnetic flux leakage around the defects. This can further be performed at a distance from the structures.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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