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СПОСОБ И УСТРОЙСТВО ДЛЯ МАГНИТОИНДУКЦИОННОЙ ТОМОГРАФИИ
专利权人:
КОНИНКЛЕЙКЕ ФИЛИПС ЭЛЕКТРОНИКС Н.В. (NL)
发明人:
ВАУХКОНЕН Марко Йоханнес (FI),ИГНЕЙ Клаудиа Ханнелоре (DE),ХАМШ Маттиас (DE),ПИНТЕР Роберт (DE)
申请号:
RU2011110377/14
公开号:
RU2011110377A
申请日:
2009.08.07
申请国别(地区):
RU
年份:
2012
代理人:
摘要:
1. An apparatus for magnetic induction tomography, comprising: - an arrangement (112, 114) transmitting coil for generating a primary magnetic field, said primary magnetic field induces an eddy current in the test object and! - an arrangement (122, 124) of measuring coils to measure the secondary magnetic field generated by the eddy current to generate a set of measurement data used for the reconstruction of the investigated object image, wherein the arrangement of transmitting coil, at least comprises a pair of transmitting coils (112, 114) intended to transmit substantially identical electric current flowing in the same direction and symmetrically arranged along a common axis (a), and wherein the arrangement of measuring coils at As it comprises a pair of pickup coils (122, 124) connected and arranged symmetrically along an axis (A). ! 2. The apparatus of claim 1, wherein a pair of transmitting coils (112, 114) and a pair of pickup coils (122, 124) represent the corresponding Helmholtz coils. ! 3. A device according to claim 1 or 2, wherein a pair of transmitting coils (112, 114) and a pair of pickup coils (122, 124) are arranged along the axis (A). ! 4. The apparatus of claim 3, wherein the distance between the pair of transmitting coils (112, 114) and a pair of pickup coils (122, 124) is defined so that the distribution of the maximum density of the eddy current in the test object, the generated pair of transmit coils, and the distribution of the maximum susceptibility pair of measurement coils have overlapping area. ! 5. The apparatus of claim 4, wherein the location of the overlap area is located between a pair of transmitting coils (112, 114)1. Устройство для магнитоиндукционной томографии, содержащее:- компоновку (112, 114) передающих катушек для генерирования первичного магнитного поля, причем первичное магнитное поле индуцирует вихревой ток в исследуемом объекте и- компоновку (122, 124) измерительных катушек для измерения вторичного магнитного поля, генери
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