Peter Munro;Konstantin Ignatyev;Alessandro Olivo;Robert Speller
发明人:
Konstantin Ignatyev,Alessandro Olivo,Peter Munro,Robert Speller
申请号：
US14233188
公开号：
US09171650B2
申请日:
2012.07.19
申请国别(地区):
US
年份:
2015
代理人:
摘要：
A method of aligning masks for phase imaging or phase contrast imaging in X-ray apparatus using a pixel-type X-ray detector makes use of non-idealities of all real detectors. A mask may be provided before the sample to generate beams, adjacent to the pixels of the detector or both. The method includes moving the mask into a plurality of translational position increments and identifying the increment for which the intensity has a maximum or minimum. The identified value of the increment may vary over the pixels of the detector. Alignment positions are selected in which steps in a plot of the increment over the area of the detector are minimized and/or aligned with the rows and columns of pixels.
