An object of the present invention is to determine whether an abnormality has occurred in a photographing state when measuring an eye to be inspected. An ophthalmologic apparatus includes a light source, a measurement optical system that irradiates light from the light source to an eye to be examined and guides reflected light from the eye to be inspected, and a reference optical system that guides light from the light source and serves as reference light. The optical path length is adjusted to a predetermined length, and an abnormality detection optical system that guides light from a light source to generate abnormality detection light, and is guided by reflected light guided by a measurement optical system and a reference optical system. Receiving the interference light for measurement obtained by multiplexing the reference light that has been combined with the reference light guided by the abnormality detection optical system and the reference light guided by the reference optical system. An element, and an arithmetic unit that determines an abnormality of the measurement interference light received by the light receiving element based on a waveform of the abnormality detection interference signal output from the light receiving element when the abnormality detection interference light is received. ing. [Selection diagram] Fig. 1【課題】被検眼の測定時に撮影状態に異常が生じていたか否かを判別する。【解決手段】眼科装置は、光源と、光源からの光を被検眼に照射すると共に被検眼からの反射光を導く測定光学系と、光源からの光を案内して参照光とする参照光学系と、光路長が所定の長さに調整されており、光源からの光を案内して異常検出光とする異常検出光学系と、測定光学系により導かれた反射光と参照光学系により案内された参照光とを合波した測定用干渉光と、異常検出光学系により案内された異常検出光と参照光学系により案内された参照光とを合波した異常検出用干渉光とを受光する受光素子と、異常検出用干渉光を受光したときに受光素子から出力される異常検出用干渉信号の波形に基づいて、受光素子で受光した測定用干渉光の異常を判定する演算装置と、を備えている。【選択図】図１
