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眼科用検査装置
专利权人:
株式会社コーナン・メディカル
发明人:
濱田 洋一
申请号:
JP2008150314
公开号:
JP5097966B2
申请日:
2008.06.09
申请国别(地区):
JP
年份:
2012
代理人:
摘要:

PROBLEM TO BE SOLVED: To provide an ophthalmologic examination apparatus examining an optionally selected region of the anterior segment of an examined eye without necessarily shifting the line of sight of the examined eye to the periphery.

SOLUTION: The ophthalmologic examination apparatus includes an illumination optical system 11 and an imaging optical system 12 for examining the examined eye, and an optical reference axis positioning mechanism. The optical reference axis positioning mechanism matches the direction of an optical reference axis, which divides the angle between the optical axis of the illumination optical system 11 and the optical axis of the imaging optical system 12 crossing each other into two sections, to a normal line at an optionally selected position on the surface of the cornea of the examined eye at least by inclining the optical reference axis or by linearly moving the optical reference axis. The optical reference axis positioning mechanism includes a first mechanism for inclining the optical reference axis within one surface, a second mechanism for inclining the axis within a surface perpendicular to the one surface, and a third mechanism 2 for advancing/retreating the axis in three axial directions including the direction toward the examined eye, which make right angles between one another.

COPYRIGHT: (C)2010,JPO&INPIT

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