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Simultaneous multi-spot inspection and imaging
专利权人:
KLA-Tencor Corporation
发明人:
Vaez-Iravani Mehdi,Miller Lawrence Robert
申请号:
US201615393658
公开号:
US9989477(B2)
申请日:
2016.12.29
申请国别(地区):
美国
年份:
2018
代理人:
Kwan & Olynick LLP
摘要:
A compact and versatile multi-spot inspection imaging system employs an objective for focusing an array of radiation beams to a surface and a second reflective or refractive objective having a large numerical aperture for collecting scattered radiation from the array of illuminated spots. The scattered radiation from each illuminated spot is focused to a corresponding optical fiber channel so that information about a scattering may be conveyed to a corresponding detector in a remote detector array for processing. In one embodiment, a one-dimensional array of illumination beams is directed at an oblique angle to the surface to illuminate a line of illuminated spots at an angle to the plane of incidence. Radiation scattered from the spots are collected along directions perpendicular to the line of spots or in a double dark field configuration.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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