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Locating a neural prosthesis using impedance and electrode height
专利权人:
James David Welland;Dao Min Zhou;Amy Hines;Jone Fine;Alan M. Horsager;Arup Roy;Robert J. Greenberg;Sumit Yadav;Matthew J. McMahon;Mark S. Humayun;Rongqing Dai
发明人:
Robert J. Greenberg,Jone Fine,Arup Roy,Matthew J. McMahon,Mark S. Humayun,James David Welland,Alan M. Horsager,Dao Min Zhou,Amy Hines,Sumit Yadav,Rongqing Dai
申请号:
US13452300
公开号:
US09597495B2
申请日:
2012.04.20
申请国别(地区):
US
年份:
2017
代理人:
摘要:
The invention is a method of identifying a preferred location for an electrode array to the neural characteristics of an individual subject. The response to electrical neural stimulation varies from subject to subject and array location to array location. Measure of impedance may be used to predict the electrode height from the neural tissue and, thereby, predict the preferred location. Alternatively, electrode height may be measured directly to predict the preferred location.
来源网站:
中国工程科技知识中心
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http://www.ckcest.cn/home/

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