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Path length calibration system and method
专利权人:
Thermo Electron Scientific Instruments LLC
发明人:
Ashmead Damian W.,Howard James V.,Kim Kevin K.,Braasch Andrew Martin
申请号:
US201615262171
公开号:
US9952139(B2)
申请日:
2016.09.12
申请国别(地区):
美国
年份:
2018
代理人:
McCarthy, III William R.
摘要:
An apparatus includes a first pedestal surface coupled to i) a swing arm and to ii) a light source. The apparatus further includes a magnet, a base plate, a mechanical stop coupled to the base plate, and a second pedestal surface mechanically coupled to said base plate and configured to receive a liquid sample, said second pedestal surface being coupled to a spectrometer. The apparatus further includes a magnetic flux sensor located between north and south magnetic flux fields of the magnet such that the magnetic flux reaching the sensor while the mechanical stop is in physical contact with the swing arm provides a linear range of output of the magnetic flux sensor, and a processor adapted to calibrate the point for minimum optical path length using a threshold magnetic flux field emitted from the magnet and detected by the magnetic flux sensor.
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