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X-RAY DETECTOR FOR PHASE CONTRAST AND/OR DARK-FIELD IMAGING
专利权人:
KONINKLIJKE PHILIPS N.V.
发明人:
Roland PROKSA
申请号:
US15745234
公开号:
US20180226168A1
申请日:
2016.07.20
申请国别(地区):
US
年份:
2018
代理人:
摘要:
The present invention relates to X-ray imaging. In order to reduce X-ray dose exposure during X-ray image acquisition, an X-ray detector is provided that is suitable for phase contrast and/or dark-field imaging. The X-ray detector comprises a scintillator layer (12) and a photodiode layer (14). The scintillator layer is configured to convert incident X- ray radiation (16) modulated by a phase grating structure (18) into light to be detected by the photodiode layer. The scintillator layer comprises an array of scintillator channels (20) periodically arranged with a pitch (22) forming an analyzer grating structure. The scintillator layer and the photodiode layer form a first detector layer (24) comprising a matrix of pixels (26). Each pixel comprises an array of photodiodes (28), each photodiode forming a sub-pixel (30). Adjacent sub-pixels during operation receive signals having mutually shifted phases. The sub-pixels that during operation receive signals having mutually identical phase form a phase group per pixel. The signals received by the sub-pixels within the same phase group per pixel during operation are combined to provide one phase group signal (32). The phase group signals of different phase groups during operation are obtained in one image acquisition. In an example, the pitch of the scintillator channels is detuned by applying a correcting factor c to a fringe period (Pfringe) of a periodic interference pattern (35) created by the phase grating structure, wherein 0<;c<;2.
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