WEJDEMANN, Christian,POULSEN, Henning Friis,LAURIDSEN, Erik Mejdal,REISCHIG, Peter
申请号：
EP20150180196
公开号：
EP3128317(A1)
申请日:
2015.08.07
申请国别(地区):
欧洲专利局
年份:
2017
代理人:
摘要：
Disclosed is method of determining one or more unit cells of a poly-crystalline sample and indexing a set DV of 3D diffraction vectors. The method comprising obtaining a plurality of candidate first lattice plane normal vectors and a plurality of candidate second lattice plane normal vectors for a particular unknown grain; using said plurality of candidate first lattice plane normal vectors and said plurality of candidate second lattice plane normal vectors to select a plurality of subsets SSDV_n of the set DV of 3D diffraction vectors and processing said plurality of subsets SSDV_n of 3D diffraction vectors to determine a primary candidate unit cell PCUC defined by three lattice vectors; wherein the primary candidate unit cell PCUC is validated by evaluating the fit of the PCUC with the full set DV of 3D diffraction vectors.
