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Techniques for correcting measurement artifacts in magnetic resonance thermometry
专利权人:
Yoav Levy
发明人:
Yoav Levy,Arik Hananel,David Freundlich,Gilad Halevy,Benny Assif,Hadas Ziso
申请号:
US13733656
公开号:
US09541621B2
申请日:
2013.01.03
申请国别(地区):
US
年份:
2017
代理人:
摘要:
Techniques for correcting measurement artifacts in MR thermometry predict or anticipate movements of objects in or near an MR imaging region that may potentially affect a phase background and then acquire a library of reference phase images corresponding to different phase backgrounds that result from the predicted movements. For each phase image subsequently acquired, one reference phase image is selected from the library of reference phase images to serve as the baseline image for temperature measurement purposes. To avoid measurement artifacts that arise from phase wrapping, the phase shift associated with each phase image is calculated incrementally, that is, by accumulating phase increments from each pair of consecutively scanned phase images.
来源网站:
中国工程科技知识中心
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http://www.ckcest.cn/home/

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