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Method And Analysis System For Eye Examinations
专利权人:
发明人:
Andreas Steinmueller
申请号:
US14264217
公开号:
US20140320815A1
申请日:
2014.04.29
申请国别(地区):
US
年份:
2014
代理人:
摘要:
An ophthalmological analysis system for examining an eye, in particular in the region of a front eye section of an eye includes first and second analysis systems obtaining sectional images of the eye. The first analysis system includes a projection device and a monitoring device arranged relative to each other according to the Scheimpflug rule. The second analysis system is an optical coherence interferometer. A processing device processes a first image data set obtained by the first analysis system and a second image data set obtained by the second analysis system to supplement the first image data set, at least partially, with data of the second image data set.
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