A cross section obtained by cutting an X-ray beam at a time of taking projection data from the X-ray beam detected by an X-ray sensor, with a plane, which is perpendicular to the central axis of the X-ray beam and runs through the central axis (O) of a photographic region (PA), is defined as a photography specification surface (SF). The number of the photography specification surface (SF) per unit area in a plane, as the photographic region (PA) is viewed from a point in the direction along the central axis (O) of the photographic region (PA), is defined as overlap density of the projection data. A controller of an X-ray photography device executes a leveling control which levels the overlap density of the projection data between at an outer portion (OP) and inner portion (IP) of the photographic region (PA). Thus, an X-ray photographic device is provided that is capable of improving the image quality in the entire photographic region.
