CHUNG, Seok,정석,SEO, Joon Seok,서준석,JEONG, Jae Un,정재운,JO, Han Sang,조한상
申请号：
KRKR2018/014159
公开号：
WO2019/132249A1
申请日:
2018.11.19
申请国别(地区):
KR
年份:
2019
代理人:
摘要：
The present invention relates to a diagnostic kit and a method for controlling the same, wherein the movement of a diagnostic sample along a flow channel of a diagnostic chip is adjusted by a diagnostic sample movement adjusting portion, and the diagnostic chip is moved by controlling a diagnostic chip movement adjusting portion, which moves the diagnostic chip in response to driving of a diagnostic sample moving portion, such that a more accurate diagnostic of a disease is possible. To this end, the present invention provides a diagnostic kit comprising: a diagnostic chip having a flow channel formed therein such that a diagnostic sample moves along the same； a diagnostic sample movement adjusting portion for adjusting the movement of the diagnostic sample by opening/closing one end of the flow channel； an optical information detecting portion for detecting optical information of the diagnostic sample； and a control portion for controlling driving of the diagnostic movement adjusting portion and the optical information detecting portion, wherein the optical information detecting portion comprises a light source portion for emitting light to the diagnostic sample and a sensing portion for sensing optical information detected from the diagnostic sample； the diagnostic sample movement adjusting portion interworks with the optical information detecting portion； and the diagnostic chip and the optical information detecting portion move relative to each other in response to driving of the diagnostic sample movement adjusting portion such that the optical information detecting portion detects optical information of the diagnostic sample moving along the flow channel.La présente invention concerne un kit de diagnostic et son procédé de commande, le mouvement d'un échantillon de diagnostic le long d'un canal d'écoulement d'une puce de diagnostic étant ajusté par une partie de réglage de mouvement d'échantillon de diagnostic, et la puce de diagnostic est déplacée par command
