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Analyzing apparatus
专利权人:
Akira Imai;Tomoyoshi Sato
发明人:
Tomoyoshi Sato,Akira Imai
申请号:
US13881915
公开号:
US09536720B2
申请日:
2011.10.31
申请国别(地区):
US
年份:
2017
代理人:
摘要:
There is provided an analyzing apparatus including an irradiation unit irradiating a first point with a laser, a convergence unit causing an analysis target to converge at the first point, and a unit analyzing a sample gas including a substance that has been irradiated with the laser at the first point using an ion mobility sensor. One example of the convergence unit includes a unit causing the analysis target to be captured in a carrier substance in a liquid state; and a discharging unit discharging the carrier substance including the analysis target to the first point.
来源网站:
中国工程科技知识中心
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