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APPARATUS AND METHOD FOR ASSESSING UTERINE PARAMETERS
专利权人:
Samsung Electronics Co.; Ltd.
发明人:
Nitin SINGHAL,Srinivas Rao KUDAVELLY
申请号:
US16618634
公开号:
US20200187896A1
申请日:
2018.06.01
申请国别(地区):
US
年份:
2020
代理人:
摘要:
A method of assessing uterine parameters via a apparatus including a processor includes determining, by the processor, at least one uterine parameter based on one or more ultrasound images of a uterus of a subject, the one or more ultrasound images being obtained on predefined days within an IVF cycle of the subject, tracking, by the processor, a change in the at least one uterine parameter, and predicting, by the processor, success of embryo implantation based on the change in the at least one uterine parameter.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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