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CHARACTERIZATION OF PLAQUE
专利权人:
Siemens Healthcare GmbH
发明人:
Thomas FLOHR,Bernhard SCHMIDT
申请号:
US15831462
公开号:
US20180165811A1
申请日:
2017.12.05
申请国别(地区):
US
年份:
2018
代理人:
摘要:
A method is for the characterization of plaque in a region of interest inside an examination subject by way of a plurality of image data sets. The image data sets have been reconstructed from a plurality of projection data sets, which have been acquired via a CT device using different X-ray energy spectra. The method includes: acquiring the image data sets, which include a plurality of pixels. Spectral parameter values are acquired on a pixel by pixel basis using at least two image data sets. Character parameter values are then acquired on a pixel by pixel basis to characterize plaques on the basis of the spectral parameter values. An analysis unit and a computed tomography system are also disclosed.
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