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Method and detection system for detecting an analyte
专利权人:
发明人:
Yasuaki Okumura,Tatsurou Kawamura,Masahiko Shioi,Masaru Minamiguchi
申请号:
US14705343
公开号:
US09964491B2
申请日:
2015.05.06
申请国别(地区):
US
年份:
2018
代理人:
摘要:
An exemplary sensor chip includes a substrate, a metal pattern formed on a side of the substrate that is irradiated with excitation light, and a first substance and a second substance provided near the metal pattern. A first intensity Xa of the first surface-enhanced Raman-scattered light from the first substance and a second intensity Xb of the second surface-enhanced Raman-scattered light from the second substance are detected. An intensity ratio Xc, as obtained by dividing the second intensity Xb with the first intensity Xa, is calculated.
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