シワ分析方法及びシワ分析装置

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专利权人:

花王株式会社

发明人:

中川 典昭,富永 昌二,堀内 隆彦,秋山 拓巳

申请号：

JP2013174176

公开号：

JP6224954B2

申请日:

2013.08.26

申请国别(地区):

JP

年份:

2017

代理人:

摘要：

PROBLEM TO BE SOLVED: To quantify a skin wrinkle condition highly accurately on the basis of skin images.SOLUTION: An analytical method for wrinkles includes steps as follows: obtaining a brightness image of skin at an analyzed-targets position calculating distribution information of power spectra for each angle by applying the Fourier transform to the skin brightness image and then calculating the directional entropy indicating the size of the deflection of the distribution of the power spectra for each angle by using the distribution information.

来源网站：

中国工程科技知识中心

来源网址：

http://www.ckcest.cn/home/