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Fitting a neural prosthesis using impedance and electrode height
专利权人:
Dao Min Zhou;Amy Hines;Alan M. Horsager;Ione Fine;Arup Roy;Robert J. Greenberg;Sumit Yadav;Matthew J. McMahon;James David Weiland;Mark S. Humayun;Rongqing Dai
发明人:
Robert J. Greenberg,Ione Fine,Arup Roy,Matthew J. McMahon,Mark S. Humayun,James David Weiland,Alan M. Horsager,Dao Min Zhou,Amy Hines,Sumit Yadav,Rongqing Dai
申请号:
US11925285
公开号:
US08190267B2
申请日:
2007.10.26
申请国别(地区):
US
年份:
2012
代理人:
摘要:
The invention is a method of automatically adjusting an electrode array to the neural characteristics of an individual subject. The response to electrical neural stimulation varies from subject to subject. Measure of impedance may be used to predict the electrode height from the neural tissue and, thereby, predict the threshold of perception. Alternatively, electrode height may be measured directly to predict the threshold of perception. Also, impedance measurement may be used to quickly identify defective electrodes and proper electrode placement.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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