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Self-aligning probes and related devices
专利权人:
The Regents of the University of California
发明人:
Hansma Paul K.,Randall Connor,Bridges Daniel
申请号:
US201314392010
公开号:
US9983107(B2)
申请日:
2013.07.22
申请国别(地区):
美国
年份:
2018
代理人:
McKinney Jeffrey A.`McKinney Law Group APC
摘要:
The field of the invention generally relates to probes, related devices and methods for measuring material properties. In an embodiment, the present invention provides a test probe for use in a reference point indentation device. The test probe has an end proximal to a tip and an end distal to the tip. The distal end of the test probe has a self-centering mate comprising a countersink of about 90 degrees to about 100 degrees to a depth of between 0.010 in. and 0.035 in.
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中国工程科技知识中心
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