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Method for the determination of dual energy image data records and X-ray facility
专利权人:
SIEMENS AKTIENGESELLSCHAFT
发明人:
Frank Dennerlein,Mathias Hoernig
申请号:
US13966481
公开号:
US09830685B2
申请日:
2013.08.14
申请国别(地区):
US
年份:
2017
代理人:
摘要:
A method for determining at least one three-dimensional image data record of a target area from two sets of projection images recorded with x-ray spectra using different energy maxima. A first set of projection images is recorded via a first X-ray spectrum and different first projection directions and a second set of projection images via a second X-ray spectrum and different second projection directions which differ at least partially from the first projection directions. A three-dimensional anatomy image data record is reconstructed from the first and the second projection images. A three-dimensional spectral image data record is reconstructed by a weighted combination of a first three-dimensional reconstruction image data record reconstructed from the first projection images, and a second three-dimensional reconstruction image data record reconstructed from the second projection images. The anatomy image data record and the spectral image data record are displayed.
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