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Method and CT system for topogram scanning
专利权人:
发明人:
Bernhard Schmidt,Martin Sedlmair
申请号:
US14520400
公开号:
US09687206B2
申请日:
2014.10.22
申请国别(地区):
US
年份:
2017
代理人:
摘要:
A method for improved utilization of a radiation dose applied to an examination object during topogram scanning of a CT system, and a CT system with a system axis using a cylindrical curved multi-row detector, are disclosed. In an embodiment, the method includes topogram scanning of the examination object with at least one emitter-detector combination disposed on a rotatable gantry from a predetermined rotation angle of the gantry, wherein during the topogram scanning a relative movement occurs between examination object and emitter-detector combination in the system axis direction calculation of at least one flat image in at least two planes running in parallel to the system axis in each case by a tomosynthesis reconstruction and storage and/or further processing of at least one of the flat images of the examination object to represent a topogram.
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