Methods utilizing triangulation in metrology systems for in-situ surgical applications

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专利权人:

发明人:

Alexey Sharonov,Candido Dionisio Pinto

申请号：

US14322264

公开号：

US09157732B2

申请日:

2014.07.02

申请国别(地区):

US

年份:

2015

代理人:

摘要：

A first metrology method includes the steps of projecting a first image and a second image, aligning the first image and the second image to form an aligned image of a known size, and determining a dimension of a target object by comparing the aligned image to the target object. A second metrology method includes the steps of projecting a first image and a second image, aligning the first image and the second image to form an aligned image of a known size by synchronously adjusting a zoom factor for projecting the first image and an angle for projecting the second image, and determining a dimension of a target object by comparing the aligned image to the target object.

来源网站：

中国工程科技知识中心

来源网址：

http://www.ckcest.cn/home/