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METHOD AND SYSTEM FOR DETERMINING THE DEFECTIVE SURFACE OF AT LEAST ONE FAULT LOCATION ON AT LEAST ONE FUNCTIONAL SURFACE OF A COMPONENT OR TEST PIECE
专利权人:
INPRO INNOVATIONSGESELLSCHAFT FÜR FORTGESCHRITTENE PRODUKTIONSSYSTEME IN DER FAHRZEUGINDUSTRIE MBH
发明人:
BANNWITZ, Peter,KÖHLER, Jan-Philipp
申请号:
WO2017DE00170
公开号:
WO2018068775(A1)
申请日:
2017.06.14
申请国别(地区):
世界知识产权组织国际局
年份:
2018
代理人:
摘要:
The invention relates to the determining of the defective surface (DF) of at least one fault location (7) on at least one functional surface Z (x, y) of a component or test piece (1), comprising the following method steps: sequentially illuminating the component or test piece (1) in at least one measurement region (2) of the functional surface Z (x, y) from at least four different positions (a, b, c, d) with at least one light source (3) that is defined in terms of the intensity, direction and position of radiation; creating a respective different actual image capture (raw image) (R a, R b, R c, R d) of the functional surface Z (x, y) in the at least one measurement region (2) using at least one camera (4) in a known position and connected to a control and computer system (5); calculating the x- or y-slope images (N x, N y) of the functional surface Z (x, y) for the four actual image captures (raw images) (R a, R b, R e, R d) on the basis of the shape-from-shading (SFS) method using the control and computer s
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