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SUBSTRATE DETERMINING METHOD
专利权人:
发明人:
申请号:
EP01270768.3
公开号:
EP1262768B1
申请日:
2001.12.11
申请国别(地区):
EP
年份:
2012
代理人:
摘要:
The present invention provides an analytical element which is free from evaporation of a sample during measurement and therefore capable of quantifying a substrate using a very small amount of sample with high accuracy and which is free from scattering of the sample during and after the measurement and therefore hygienically excellent and a measuring device and a substrate quantification method using the same. The analytical element comprises a cavity for accommodating a sample, a working electrode and a counter electrode exposed to an inside of the cavity, a reagent layer which comprises at least an oxidoreductase and is formed inside or in the vicinity of the cavity, an opening communicating with the cavity and a member covering the opening.
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