PROBLEM TO BE SOLVED: To provide a measurement apparatus highly accurately and relatively easily measuring the local absorptive scattering characteristics of a specimen.SOLUTION: In the measurement apparatus 100 for measuring a spectroscopic characteristic of a measurement site X in the specimen E by applying AOT, the measurement apparatus 100 includes a measurement unit for measuring the light intensity of a measurement area MA set differently from the measurement site X on a light propagation path P from the measurement site X to a detection position, and a signal processing device 10 for sequentially modifying the spectroscopic characteristics of the measurement area MA and the measurement site X on the light propagation path P from a light detector 8 to the measurement site X by using the light intensity in the measurement area MA in the outermost peripheral area G closest to a surface layer E1 of the specimen E that is measured by the measurement unit.COPYRIGHT: (C)2009,JPO&INPIT【課題】被検体の局所的な吸収散乱特性を高精度かつ比較的簡単に測定することが可能な測定装置を提供する。【解決手段】被検体Ｅ内部の被検部位Ｘの分光特性をＡＯＴを利用して測定する測定装置１００において、被検部位Ｘから検出位置までの光の伝播経路Ｐ上に被検部位Ｘとは別に設定された被測定領域ＭＡの光強度を測定する測定部と、測定部が測定した被検体Ｅの表層Ｅ１に最も近い最外周領域Ｇにある被測定領域ＭＡの光強度を利用して、光の伝播経路Ｐ上にある被測定領域ＭＡ及び被検部位Ｘの分光特性を光検出器８から被検部位Ｘに向かって順次修正する信号処理装置１０と、を有することを特徴とする測定装置１００を提供する。【選択図】図１
