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Random estimation in positron emission tomography with tangential time-of-flight mask
专利权人:
Xiaofeng Niu
发明人:
Xiaofeng Niu,Wenli Wang
申请号:
US13467090
公开号:
US09241678B2
申请日:
2012.05.09
申请国别(地区):
US
年份:
2016
代理人:
摘要:
A method of estimating random events in positron emission tomography list mode data, including obtaining time-of-flight (TOF) list mode count data that includes TOF information converting the obtained TOF list mode count data into four-dimensional (4D) raw sinogram count data, without using the TOF information, wherein the 4D raw sinogram count data includes random count values interpolating the 4D raw sinogram count data to generate 4D interpolated sinogram count data low-pass filtering the 4D interpolated sinogram count data to remove noise converting the low-pass filtered 4D interpolated sinogram count data into filtered 4D raw sinogram count data and generating, by a processor, five-dimensional (5D) TOF raw sinogram count data from the filtered 4D raw sinogram count data by effectively applying a TOF mask filter to the filtered 4D raw sinogram count data.
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中国工程科技知识中心
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http://www.ckcest.cn/home/

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