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TOPCOAT COMPOSITIONS AND PATTERN-FORMING METHODS
专利权人:
Rohm and Haas Electronic Materials LLC
发明人:
Kaur Irvinder,Liu Cong,Kang Doris,Li Mingqi,Wang Deyan,Zhou Huaxing
申请号:
US201715730876
公开号:
US2018118970(A1)
申请日:
2017.10.12
申请国别(地区):
美国
年份:
2018
代理人:
摘要:
Topcoat compositions comprise: a matrix polymer; a surface active polymer comprising a polymerized unit formed from a monomer of the following general formula (I):;;wherein: R1 represents H, F, methyl or fluorinated methyl; R2 represents optionally substituted C1 to C8 alkylene or optionally substituted C1 to C8 fluoroalkylene, optionally comprising one or more heteroatom; R3 represents H, F, optionally substituted C1 to C10 alkyl or optionally substituted C5 to C15 aryl, optionally comprising one or more heteroatom; R4 represents optionally substituted C1 to C8 alkyl, optionally substituted C1 to C8 fluoroalkyl or optionally substituted C5 to C15 aryl, optionally comprising one or more heteroatom; X represents O, S or NR5, wherein R5 is chosen from hydrogen and optionally substituted C1 to C5 alkyl; and a is 0 or 1; and a solvent. Also provided are coated substrates and pattern-forming methods which make use of the topcoat compositions. The invention has particular applicability in photolithographic processe
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