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SPECTROMETER INCLUDING VERTICAL STACK STRUCTURE AND NON-INVASIVE BIOMETRIC SENSOR INCLUDING THE SPECTROMETER
专利权人:
SAMSUNG ELECTRONICS CO.; LTD.
发明人:
Dongho KIM
申请号:
US14821933
公开号:
US20160120410A1
申请日:
2015.08.10
申请国别(地区):
US
年份:
2016
代理人:
摘要:
Provided are a spectrometer that may be easily manufactured while having high resolution and sensitivity due to reduced light loss and a non-invasive biometric sensor including the spectrometer. The spectrometer includes: a stacked light absorbing structure including a plurality of absorbing layers stacked in a vertical direction and having different absorption wavelength bands, and a plurality of tunnel junction layers respectively interposed between the plurality of absorbing layers to electrically connect the plurality of absorbing layers; and an illuminating unit configured to provide the stacked light absorbing structure with an illumination light for saturation of the plurality of absorbing layers.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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