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PROCÉDÉ DE MESURE D'UN ÉTAT CUTANÉ ET DISPOSITIF ÉLECTRONIQUE ASSOCIÉ
专利权人:
Samsung Electronics Co.; Ltd.
发明人:
申请号:
EP17853298.2
公开号:
EP3517023A1
申请日:
2017.08.18
申请国别(地区):
EP
年份:
2019
代理人:
摘要:
A method for measuring skin by an electronic device according to various embodiments of the disclosure comprises: an operation of irradiating at least one light into skin to which a patch is adhered; an operation of detecting at least one reflected light on the basis of an amount of moisture in the skin, which is changed by physiologically active substances injected through the patch, corresponding to the irradiated light; an operation of generating patch adherence information indicating a skin adhesive state of the patch on the basis of the detection result of the at least one reflected light; and an operation of providing the generated patch adherence information to an output unit or a communication unit.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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